Discriminant approach to detect anomalies using Markov sequences

A.V. Skatkov, A.A. Bryukhovetskiy, D.V. Moiseev, Yu.E. Shishkin

 1Sevastopol State University, RF, Sevastopol, Universitetskaya St., 33

Email: dmitriymoiseev@mail.ru

2Institute of Natural and Technical Systems, RF, Sevastopol, Lenin St., 28

DOI: 10.33075/2220-5861-2019-4-43-49

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